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Metrology Product Applications For The Served Monitoring And Testing Industry
2 applications found
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Flex circuit technologies pose a wide range of metrology challenges with a large number of different circuit geometries, pitch dimensions, and surface reflectivity factors. To meet these challenges, metrology systems for flex circuit inspection must incorporate advanced functionality such as versatile lighting, large-size stages, high-resolution positioning, and very accurate laser probe ...
ByVIEW Micro Metrology based in Rochester, NEW YORK (USA)
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Quad Flat Pack (QFP) and Ball Grid Array (BGA) components represent metrology challenges with very tight tolerances that can tax the capabilities of even high performance systems. ...
ByVIEW Micro Metrology based in Rochester, NEW YORK (USA)