Laboratory X-Ray Solutions for Materials Science & Geology
Sigray`s products were designed to optimize performance for time-based studies of samples in situ (e.g. on flow or fracturing), measuring changes to composition, chemical state, and microstructure.
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Composition: Spatially resolved elemental distribution
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Microstructure: Internal microstructural information
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Chemistry: Chemical speciation, bond length, and electron state
ELEMENTAL DISTRIBUTION
The distribution of elements and their relative quantities are key determinants of how a material performs or how efficiently a natural resource can be extracted.
With its ultrahigh (sub-ppm) sensitivity and microns-scale resolution, the AttoMap enables accurate quantification of trace elements and contaminants at higher sensitivity than electron microprobes.
Multi-Length Scale & Correlative
X-rays are ideal for non-destructive, rapid surveys at microns-scale resolution. Correlative applications include:
- Sub-ppm trace elemental mapping for higher sensitivity to complement electron microscopy (e.g. QEMSCAN, MLA)
- Identify ROIs for destructive FIB-SEM
Quantitative Coating or Buried Layer Thickness
Spatially resolved thickness variations of buried layers and coatings can be analyzed without requiring standards.