Combined/hybrid Raman Systems
Combine inVia with a scanning probe microscope (SPM), such as an atomic force microscope (AFM), to investigate the chemical and structural properties of materials. Add nanometre-scale chemical resolution with TERS, and reveal complementary information such as mechanical properties.
Bring inVia`s Raman analysis capabilities to a scanning electron microscope with Renishaw`s Raman SEM-SCA interface. Use the SEM to record high-resolution images of your sample and perform elemental analysis using x-rays. Add the power of Raman to identify materials and non-metallic compounds, even when they have the same stoichiometry.
Take measurements to directly correlate mechanical properties from indentation with comprehensive chemical analyses from Raman,in situ.
CLSM: confocal images
If you have samples with complex 3D structures (perhaps biological cells), you can add a confocal laser scanning microscope (CLSM) to your inVia and correlate confocal fluorescence images with Raman chemical images.