Nidek -Model FT-17 -Flatness Tester
FromNidek Co., Ltd.
The measured data can be quickly acquired by full surface analysis with laser light. The measurement result can be displayed as measured values, contour map, bird`s-eye view, cross-section view, etc. Original phase shift method is applicable to multiple interference fringes System control with exclusive analyzer running on the Windows platform provides easy operation. Transparent samples can not only be analyzed but also be measured with minimized interference of rear surface. The measurement result once obtained from sample data can be re-calculated to reflect changes in perimeter exclusion range, etc. Special calibration is unnecessary, pre-operation check with customer`s referential samples is recommended.
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