Topsil - Model FZ-UHPS - Uniform High Purity Silicon for Silicon Drift Detectors
Topsil has designed a unique uniform float zone based high purity silicon substrate (UHPS) with tight resistivity tolerance performing up to unprecedented level. The substrate targets high resolution x-ray, particle and optical detectors. The silicon wafers allow for higher energy resolution and shorter shaping times of detectors used in e.g. space science, crystallography and the medical industry.
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Products Details
The UHPS wafers are characterised by:
- Crystal perfectness
- Optimised resistivity variation
- Precise doping uniformity
- Precise resistivity control
Topsil UHPS silicon substrate has very homogeneous distribution and is available as 100 and 150 mm wafers.
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